Astrophysics XIS-6545DV

The XIS-6545DVTM is an advanced X-Ray Inspection System (XIS) with the most power available for a system with its tunnel size. The dual generators are offset by 90°, providing two upward, diagonal views of scanned objects. Each view can be manipulated independently, with separate image filters. This unique configuration allows operators to inspect bags in depth and gives the system a compact footprint well-suited to confined spaces.